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Microstructure and property measurements on in situ TiB2/70Si-Al composite for electronic packaging applications
Microstructure and property measurements on in situ TiB2/70Si-Al composite for electronic packaging applications
Microstructure and property measurements on in situ TiB2/70Si-Al composite for electronic packaging applications
Zhang, L. (author) / Gan, G.S. (author) / Yang, B. (author) / Leng, J. / Mosallam, A. / Lau, A.K.-T.
2012-01-01
5 pages
Article (Journal)
English
DDC:
620.0042
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