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Analysis of Dislocations Nucleated after Nano Indentation Tests at Room Temperature in 4H-SiC
Analysis of Dislocations Nucleated after Nano Indentation Tests at Room Temperature in 4H-SiC
Analysis of Dislocations Nucleated after Nano Indentation Tests at Room Temperature in 4H-SiC
Demenet, J.L. (author) / Amer, M. (author) / Tromas, C. (author) / Rabier, J. (author)
MATERIALS SCIENCE FORUM ; 717/720 ; 339-342
2012-01-01
4 pages
Article (Journal)
English
DDC:
620.11
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