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Comparative Study of Electrical and Microstructural Properties of 4H-SiC MOSFETs

Strenger, C. / Haublein, V. / Erlbacher, T. / Bauer, A.J. / Ryssel, H. / Beltran, A.M. / Schamm-Chardon, S. / Mortet, V. / Bedel-Pereira, E. / Lefebvre, M.

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Comparative Study of Electrical and Microstructural Properties of 4H-SiC MOSFETs

Strenger, C. / Haublein, V. / Erlbacher, T. / Bauer, A.J. / Ryssel, H. / Beltran, A.M. / Schamm-Chardon, S. / Mortet, V. / Bedel-Pereira, E. / Lefebvre, M.

Comparative Study of Electrical and Microstructural Properties of 4H-SiC MOSFETs

Strenger, C. / Haublein, V. / Erlbacher, T. / Bauer, A.J. / Ryssel, H. / Beltran, A.M. / Schamm-Chardon, S. / Mortet, V. / Bedel-Pereira, E. / Lefebvre, M.

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Title:

Comparative Study of Electrical and Microstructural Properties of 4H-SiC MOSFETs

Contributors:

Strenger, C. (author) / Haublein, V. (author) / Erlbacher, T. (author) / Bauer, A.J. (author) / Ryssel, H. (author) / Beltran, A.M. (author) / Schamm-Chardon, S. (author) / Mortet, V. (author) / Bedel-Pereira, E. (author) / Lefebvre, M. (author)

Published in:

MATERIALS SCIENCE FORUM ; 717/720 ; 437-440

Publication date:

2012-01-01

Size:

4 pages

ISSN:

Type of media:

Article (Journal)

Type of material:

Print

Language:

English

Classification:

© Metadata Copyright the British Library Board and other contributors. All rights reserved.

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