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    Demonstration of SiC Vertical Trench JFET Reliability

    New search for: Speer, K.M.
    New search for: Chatty, K.
    New search for: Bondarenko, V.
    New search for: Sheridan, D.C.
    New search for: Matocha, K.
    New search for: Casady, J.B.

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    Demonstration of SiC Vertical Trench JFET Reliability

    New search for: Speer, K.M.
    New search for: Chatty, K.
    New search for: Bondarenko, V.
    New search for: Sheridan, D.C.
    New search for: Matocha, K.
    New search for: Casady, J.B.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Demonstration of SiC Vertical Trench JFET Reliability

    New search for: Speer, K.M.
    New search for: Chatty, K.
    New search for: Bondarenko, V.
    New search for: Sheridan, D.C.
    New search for: Matocha, K.
    New search for: Casady, J.B.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Demonstration of SiC Vertical Trench JFET Reliability

    Contributors:

    Speer, K.M. (author) / Chatty, K. (author) / Bondarenko, V. (author) / Sheridan, D.C. (author) / Matocha, K. (author) / Casady, J.B. (author)

    Published in:

    MATERIALS SCIENCE FORUM ; 717/720 ; 1017-1020

    Publication date:

    2012-01-01

    Size:

    4 pages

    ISSN:

    0255-5476

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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