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    Microscopic Degradation Analysis of RF-Stressed AlGaN/GaN HEMTs

    New search for: Gutle, F.
    New search for: Baeumler, M.
    New search for: Dammann, M.
    New search for: Casar, M.
    New search for: Walcher, H.
    New search for: Waltereit, P.
    New search for: Bronner, W.
    New search for: Muller, S.
    New search for: Kiefer, R.
    New search for: Quay, R.
    New search for: Yamada-Kaneta, H.
    New search for: Sakai, A.

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    Microscopic Degradation Analysis of RF-Stressed AlGaN/GaN HEMTs

    New search for: Gutle, F.
    New search for: Baeumler, M.
    New search for: Dammann, M.
    New search for: Casar, M.
    New search for: Walcher, H.
    New search for: Waltereit, P.
    New search for: Bronner, W.
    New search for: Muller, S.
    New search for: Kiefer, R.
    New search for: Quay, R.
    New search for: Yamada-Kaneta, H.
    New search for: Sakai, A.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Microscopic Degradation Analysis of RF-Stressed AlGaN/GaN HEMTs

    New search for: Gutle, F.
    New search for: Baeumler, M.
    New search for: Dammann, M.
    New search for: Casar, M.
    New search for: Walcher, H.
    New search for: Waltereit, P.
    New search for: Bronner, W.
    New search for: Muller, S.
    New search for: Kiefer, R.
    New search for: Quay, R.
    New search for: Yamada-Kaneta, H.
    New search for: Sakai, A.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

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    Document information
    Title:

    Microscopic Degradation Analysis of RF-Stressed AlGaN/GaN HEMTs

    Contributors:

    Gutle, F. (author) / Baeumler, M. (author) / Dammann, M. (author) / Casar, M. (author) / Walcher, H. (author) / Waltereit, P. (author) / Bronner, W. (author) / Muller, S. (author) / Kiefer, R. (author) / Quay, R. (author)

    Published in:

    Defects-Recognition, Imaging and Physics in Semiconductors XIV ; 79-84

    MATERIALS SCIENCE FORUM ; 725

    Publication date:

    2012-01-01

    Size:

    6 pages

    ISSN:

    0255-5476

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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