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    Structural and optical characterization of high-quality ZnO thin films deposited by reactive RF magnetron sputtering

    New search for: Zhang, X. L.
    New search for: Hui, K. N.
    New search for: Hui, K. S.
    New search for: Singh, J.

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    Structural and optical characterization of high-quality ZnO thin films deposited by reactive RF magnetron sputtering

    New search for: Zhang, X. L.
    New search for: Hui, K. N.
    New search for: Hui, K. S.
    New search for: Singh, J.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Structural and optical characterization of high-quality ZnO thin films deposited by reactive RF magnetron sputtering

    New search for: Zhang, X. L.
    New search for: Hui, K. N.
    New search for: Hui, K. S.
    New search for: Singh, J.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Structural and optical characterization of high-quality ZnO thin films deposited by reactive RF magnetron sputtering

    Contributors:

    Zhang, X. L. (author) / Hui, K. N. (author) / Hui, K. S. (author) / Singh, J. (author)

    Published in:

    MATERIALS RESEARCH BULLETIN ; 48 ; 1093-1098

    Publication date:

    2013-01-01

    Size:

    6 pages

    ISSN:

    0025-5408

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11 / 620

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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