Fachinformationsdienst BAUdigital

A platform for research: civil engineering, architecture and urbanism

    Dislocation Analysis of 4H-/6H-SiC Single Crystals Using Micro-Raman Spectroscopy

    New search for: Shin, Y.J.
    New search for: Kim, W.J.
    New search for: Kim, H.Y.
    New search for: Bahng, W.
    New search for: Lebedev, A.A.
    New search for: Davydov, S.Y.
    New search for: Ivanov, P.A.
    New search for: Levinshtein, M.E.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Dislocation Analysis of 4H-/6H-SiC Single Crystals Using Micro-Raman Spectroscopy

    New search for: Shin, Y.J.
    New search for: Kim, W.J.
    New search for: Kim, H.Y.
    New search for: Bahng, W.
    New search for: Lebedev, A.A.
    New search for: Davydov, S.Y.
    New search for: Ivanov, P.A.
    New search for: Levinshtein, M.E.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Dislocation Analysis of 4H-/6H-SiC Single Crystals Using Micro-Raman Spectroscopy

    New search for: Shin, Y.J.
    New search for: Kim, W.J.
    New search for: Kim, H.Y.
    New search for: Bahng, W.
    New search for: Lebedev, A.A.
    New search for: Davydov, S.Y.
    New search for: Ivanov, P.A.
    New search for: Levinshtein, M.E.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Dislocation Analysis of 4H-/6H-SiC Single Crystals Using Micro-Raman Spectroscopy

    Contributors:

    Shin, Y.J. (author) / Kim, W.J. (author) / Kim, H.Y. (author) / Bahng, W. (author) / Lebedev, A.A. / Davydov, S.Y. / Ivanov, P.A. / Levinshtein, M.E.

    Published in:

    Silicon Carbide and Related Materials 2012 Selected, peer reviewed papers from the 9th European Conference on Silicon Carbide and Related Materials (ECSCRM 2012), September 2-6, 2012, St. Petersburg, Russian Federation ; 481-484

    MATERIALS SCIENCE FORUM ; 740/742

    Publication date:

    2013-01-01

    Size:

    4 pages

    ISSN:

    0255-5476

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

    Similar titles

    Dislocation motion in erbia single crystals

    Sharif, A. A. / Misra, A. / Petrovic, J. J. et al. | British Library Online Contents | 2000

    Dislocation imaging in fcc colloidal single crystals

    Schall, P. / Spaepen, F. | British Library Online Contents | 2006

    Microhardness and Raman Spectroscopy for Characterization of Fullerite Single Crystals

    Haluska, M. / Zehetbauer, M. / Human, M. et al. | British Library Online Contents | 1996

    Microhardness and Raman Spectroscopy for Characterization of Fullerite Single Crystals

    Haluska, M. / Zehetbauer, M. / Hulman, M. et al. | British Library Online Contents | 1996

    Micro-Raman spectroscopy of thaumasite

    Brough, A.R. | Online Contents | 2001

    Back to top