Stress Relaxation Study in 3C-SiC Microstructures by Micro-Raman Analysis and Finite Element Modeling: Fid-Bau Portal

Stress Relaxation Study in 3C-SiC Microstructures by Micro-Raman Analysis and Finite Element Modeling

Piluso, N. / Anzalone, R. / Severino, A. / Canino, A. / La Magna, A. / D Arrigo, G. / La Via, F.

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Stress Relaxation Study in 3C-SiC Microstructures by Micro-Raman Analysis and Finite Element Modeling

Piluso, N. / Anzalone, R. / Severino, A. / Canino, A. / La Magna, A. / D Arrigo, G. / La Via, F.

Stress Relaxation Study in 3C-SiC Microstructures by Micro-Raman Analysis and Finite Element Modeling

Piluso, N. / Anzalone, R. / Severino, A. / Canino, A. / La Magna, A. / D Arrigo, G. / La Via, F.

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Title:

Stress Relaxation Study in 3C-SiC Microstructures by Micro-Raman Analysis and Finite Element Modeling

Contributors:

Piluso, N. (author) / Anzalone, R. (author) / Severino, A. (author) / Canino, A. (author) / La Magna, A. (author) / D Arrigo, G. (author) / La Via, F. (author) / Lebedev, A.A. / Davydov, S.Y. / Ivanov, P.A.

Published in:

Silicon Carbide and Related Materials 2012 Selected, peer reviewed papers from the 9th European Conference on Silicon Carbide and Related Materials (ECSCRM 2012), September 2-6, 2012, St. Petersburg, Russian Federation ; 673-676

MATERIALS SCIENCE FORUM ; 740/742

Publication date:

2013-01-01

Size:

4 pages

ISSN:

0255-5476

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

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