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    FT IR spectroscopy of silicon oxide layers prepared with perchloric acid

    New search for: Kopani, M.
    New search for: Mikula, M.
    New search for: Takahashi, M.
    New search for: Rusnak, J.
    New search for: Pincik, E.

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    FT IR spectroscopy of silicon oxide layers prepared with perchloric acid

    New search for: Kopani, M.
    New search for: Mikula, M.
    New search for: Takahashi, M.
    New search for: Rusnak, J.
    New search for: Pincik, E.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    FT IR spectroscopy of silicon oxide layers prepared with perchloric acid

    New search for: Kopani, M.
    New search for: Mikula, M.
    New search for: Takahashi, M.
    New search for: Rusnak, J.
    New search for: Pincik, E.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

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    Document information
    Title:

    FT IR spectroscopy of silicon oxide layers prepared with perchloric acid

    Contributors:

    Kopani, M. (author) / Mikula, M. (author) / Takahashi, M. (author) / Rusnak, J. (author) / Pincik, E. (author)

    Published in:

    APPLIED SURFACE SCIENCE ; 269 ; 106-109

    Publication date:

    2013-01-01

    Size:

    4 pages

    ISSN:

    0169-4332

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  621.35

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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