A platform for research: civil engineering, architecture and urbanism
Influence of non-Gaussian roughness on sputter depth profiles
Influence of non-Gaussian roughness on sputter depth profiles
Influence of non-Gaussian roughness on sputter depth profiles
Liu, Y. (author) / Jian, W. (author) / Wang, J. Y. (author) / Hofmann, S. (author) / Kovac, J. (author)
APPLIED SURFACE SCIENCE ; 276 ; 447-453
2013-01-01
7 pages
Article (Journal)
English
DDC:
621.35
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
The simulation of nanoscale sputter depth profiles using molecular dynamics
British Library Online Contents | 2009
|Analysis of Auger sputter depth profiles with a resolution function
British Library Online Contents | 1996
|Analysis of Auger sputter depth profiles with a resolution function
British Library Online Contents | 1996
|Springer Verlag | 1992
|Depth resolution for AES sputter profiles of GaAs/GaInAs strained superlattices
British Library Online Contents | 1993
|