Fachinformationsdienst BAUdigital

A platform for research: civil engineering, architecture and urbanism

    Study and optimisation of SIMS performed with He^+ and Ne^+ bombardment

    New search for: Pillatsch, L.
    New search for: Vanhove, N.
    New search for: Dowsett, D.
    New search for: Sijbrandij, S.
    New search for: Notte, J.
    New search for: Wirtz, T.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Study and optimisation of SIMS performed with He^+ and Ne^+ bombardment

    New search for: Pillatsch, L.
    New search for: Vanhove, N.
    New search for: Dowsett, D.
    New search for: Sijbrandij, S.
    New search for: Notte, J.
    New search for: Wirtz, T.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Study and optimisation of SIMS performed with He^+ and Ne^+ bombardment

    New search for: Pillatsch, L.
    New search for: Vanhove, N.
    New search for: Dowsett, D.
    New search for: Sijbrandij, S.
    New search for: Notte, J.
    New search for: Wirtz, T.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Study and optimisation of SIMS performed with He^+ and Ne^+ bombardment

    Contributors:

    Pillatsch, L. (author) / Vanhove, N. (author) / Dowsett, D. (author) / Sijbrandij, S. (author) / Notte, J. (author) / Wirtz, T. (author)

    Published in:

    APPLIED SURFACE SCIENCE ; 282 ; 908-913

    Publication date:

    2013-01-01

    Size:

    6 pages

    ISSN:

    0169-4332

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  621.35

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

    Similar titles

    Fast atom beam bombardment secondary ion mass spectrometry: FAB-SIMS

    Hayashi, H. / Satake, T. / Kaneko, K. et al. | British Library Online Contents | 1993

    Fast atom beam bombardment secondary ion mass spectrometry: FAB-SIMS

    Hayashi, H. / Satake, T. / Kaneko, K. et al. | British Library Online Contents | 1993

    Metal-assisted SIMS and cluster ion bombardment for ion yield enhancement

    Heile, A. / Lipinsky, D. / Wehbe, N. et al. | British Library Online Contents | 2008

    Ion-bombardment artifact in TOF-SIMS analysis of ZrO2/SiO2/Si stacks

    De Witte, H. / Conard, T. / Vandervorst, W. et al. | British Library Online Contents | 2003

    Apparent and real transient effects in SIMS depth profiling using oxygen bombardment

    Wittmaack, K. | British Library Online Contents | 2003

    Back to top