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    High-cycle fatigue strength and small-crack growth behavior of ultrafine-grained copper with post-ECAP annealing

    New search for: Goto, M.
    New search for: Teshima, N.
    New search for: Han, S. Z.
    New search for: Euh, K.
    New search for: Yakushiji, T.
    New search for: Kim, S. S.
    New search for: Lee, J.

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    High-cycle fatigue strength and small-crack growth behavior of ultrafine-grained copper with post-ECAP annealing

    New search for: Goto, M.
    New search for: Teshima, N.
    New search for: Han, S. Z.
    New search for: Euh, K.
    New search for: Yakushiji, T.
    New search for: Kim, S. S.
    New search for: Lee, J.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    High-cycle fatigue strength and small-crack growth behavior of ultrafine-grained copper with post-ECAP annealing

    New search for: Goto, M.
    New search for: Teshima, N.
    New search for: Han, S. Z.
    New search for: Euh, K.
    New search for: Yakushiji, T.
    New search for: Kim, S. S.
    New search for: Lee, J.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
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    Document information
    Title:

    High-cycle fatigue strength and small-crack growth behavior of ultrafine-grained copper with post-ECAP annealing

    Contributors:

    Goto, M. (author) / Teshima, N. (author) / Han, S. Z. (author) / Euh, K. (author) / Yakushiji, T. (author) / Kim, S. S. (author) / Lee, J. (author)

    Published in:

    ENGINEERING FRACTURE MECHANICS ; 110 ; 218-232

    Publication date:

    2013-01-01

    Size:

    15 pages

    ISSN:

    0013-7944

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.1 / 126

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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