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    Simulation of Transmission Electron Microscope Images of Dislocations Pinned by Obstacles

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    Simulation of Transmission Electron Microscope Images of Dislocations Pinned by Obstacles

    New search for: Satoh, Y.
    New search for: Hatano, T.
    New search for: Nita, N.
    New search for: Nogiwa, K.
    New search for: Matsui, H.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Simulation of Transmission Electron Microscope Images of Dislocations Pinned by Obstacles

    New search for: Satoh, Y.
    New search for: Hatano, T.
    New search for: Nita, N.
    New search for: Nogiwa, K.
    New search for: Matsui, H.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

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    Check availability in my library
    Order at Subito €

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    Document information
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    Document information
    Title:

    Simulation of Transmission Electron Microscope Images of Dislocations Pinned by Obstacles

    Contributors:

    Satoh, Y. (author) / Hatano, T. (author) / Nita, N. (author) / Nogiwa, K. (author) / Matsui, H. (author)

    Published in:

    MATERIALS TRANSACTIONS ; 55 ; 413-417

    Publication date:

    2014-01-01

    Size:

    5 pages

    ISSN:

    1345-9678

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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