Fachinformationsdienst BAUdigital

A platform for research: civil engineering, architecture and urbanism

    Nanomechanical Analysis of Triangular Defect in 4H-SiC Epilayer

    New search for: Shin, Y.J.
    New search for: Kim, S.I.
    New search for: Jung, H.J.
    New search for: Lee, C.W.
    New search for: Bahng, W.
    New search for: Okumura, H.
    New search for: Harima, H.
    New search for: Kimoto, T.
    New search for: Yoshimoto, M.
    New search for: Watanabe, H.
    New search for: Hatayama, T.
    New search for: Matsuura, H.
    New search for: Funaki, T.
    New search for: Sano, Y.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Nanomechanical Analysis of Triangular Defect in 4H-SiC Epilayer

    New search for: Shin, Y.J.
    New search for: Kim, S.I.
    New search for: Jung, H.J.
    New search for: Lee, C.W.
    New search for: Bahng, W.
    New search for: Okumura, H.
    New search for: Harima, H.
    New search for: Kimoto, T.
    New search for: Yoshimoto, M.
    New search for: Watanabe, H.
    New search for: Hatayama, T.
    New search for: Matsuura, H.
    New search for: Funaki, T.
    New search for: Sano, Y.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Nanomechanical Analysis of Triangular Defect in 4H-SiC Epilayer

    New search for: Shin, Y.J.
    New search for: Kim, S.I.
    New search for: Jung, H.J.
    New search for: Lee, C.W.
    New search for: Bahng, W.
    New search for: Okumura, H.
    New search for: Harima, H.
    New search for: Kimoto, T.
    New search for: Yoshimoto, M.
    New search for: Watanabe, H.
    New search for: Hatayama, T.
    New search for: Matsuura, H.
    New search for: Funaki, T.
    New search for: Sano, Y.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Nanomechanical Analysis of Triangular Defect in 4H-SiC Epilayer

    Contributors:

    Shin, Y.J. (author) / Kim, S.I. (author) / Jung, H.J. (author) / Lee, C.W. (author) / Bahng, W. (author) / Okumura, H. / Harima, H. / Kimoto, T. / Yoshimoto, M. / Watanabe, H.

    Published in:

    Silicon Carbide and Related Materials 2013 PART 1 Selected, peer reviewed papers from the 15^t^h International Conference on Silicon Carbide and Related Materials, (ICSCRM 2013), September 29 - October 4, 2013, Miyazaki, Japan ; 394-397

    MATERIALS SCIENCE FORUM ; 778/780

    Publication date:

    2014-01-01

    Size:

    4 pages

    ISSN:

    0255-5476

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

    Similar titles

    Thick Epilayer for Power Devices

    Henry, A. / Hassan, J. / Pedersen, H. et al. | British Library Online Contents | 2007

    Influence of precipitates on GaN epilayer quality

    Kang, J. / Huang, Q. / Wang, Z. | British Library Online Contents | 2000

    Lift-off and re-growth of ZnSSe epilayer

    Lee, M. K. / Tsay, B. T. / Shih, T. H. | British Library Online Contents | 2001

    Four states memory function in GaMnAs ferromagenic semiconductor epilayer

    Sanghoon Lee, / Shin, D. Y. / Liu, X. et al. | IEEE | 2006

    Surface Studies on Thermal Oxidation on 4H-SiC Epilayer

    Koh, A. / Kestle, A. / Wilks, S. P. et al. | British Library Online Contents | 2000

    Back to top