Fachinformationsdienst BAUdigital

A platform for research: civil engineering, architecture and urbanism

    High Voltage and Fast Switching Reverse Recovery Characteristics of 4H-SiC PiN Diode

    New search for: Nakayama, K.
    New search for: Ogata, S.
    New search for: Hayashi, T.
    New search for: Hemmi, T.
    New search for: Tanaka, A.
    New search for: Izumi, T.
    New search for: Asano, K.
    New search for: Okamoto, D.
    New search for: Tanaka, Y.
    New search for: Mizushima, T.
    New search for: Okumura, H.
    New search for: Harima, H.
    New search for: Kimoto, T.
    New search for: Yoshimoto, M.
    New search for: Watanabe, H.
    New search for: Hatayama, T.
    New search for: Matsuura, H.
    New search for: Funaki, T.
    New search for: Sano, Y.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    High Voltage and Fast Switching Reverse Recovery Characteristics of 4H-SiC PiN Diode

    New search for: Nakayama, K.
    New search for: Ogata, S.
    New search for: Hayashi, T.
    New search for: Hemmi, T.
    New search for: Tanaka, A.
    New search for: Izumi, T.
    New search for: Asano, K.
    New search for: Okamoto, D.
    New search for: Tanaka, Y.
    New search for: Mizushima, T.
    New search for: Okumura, H.
    New search for: Harima, H.
    New search for: Kimoto, T.
    New search for: Yoshimoto, M.
    New search for: Watanabe, H.
    New search for: Hatayama, T.
    New search for: Matsuura, H.
    New search for: Funaki, T.
    New search for: Sano, Y.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    High Voltage and Fast Switching Reverse Recovery Characteristics of 4H-SiC PiN Diode

    New search for: Nakayama, K.
    New search for: Ogata, S.
    New search for: Hayashi, T.
    New search for: Hemmi, T.
    New search for: Tanaka, A.
    New search for: Izumi, T.
    New search for: Asano, K.
    New search for: Okamoto, D.
    New search for: Tanaka, Y.
    New search for: Mizushima, T.
    New search for: Okumura, H.
    New search for: Harima, H.
    New search for: Kimoto, T.
    New search for: Yoshimoto, M.
    New search for: Watanabe, H.
    New search for: Hatayama, T.
    New search for: Matsuura, H.
    New search for: Funaki, T.
    New search for: Sano, Y.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    High Voltage and Fast Switching Reverse Recovery Characteristics of 4H-SiC PiN Diode

    Contributors:

    Nakayama, K. (author) / Ogata, S. (author) / Hayashi, T. (author) / Hemmi, T. (author) / Tanaka, A. (author) / Izumi, T. (author) / Asano, K. (author) / Okamoto, D. (author) / Tanaka, Y. (author) / Mizushima, T. (author)

    Published in:

    Silicon Carbide and Related Materials 2013 ; 841-844

    MATERIALS SCIENCE FORUM ; 778/780

    Publication date:

    2014-01-01

    Size:

    4 pages

    ISSN:

    0255-5476

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

    Similar titles

    Reverse Recovery and Avalanche Injection in High Voltage SiC PIN Diodes

    Domeij, M. / Breitholtz, B. / Linnros, J. et al. | British Library Online Contents | 1998

    Reverse Characteristics of a 4H-SiC Schottky Barrier Diode

    Hatakeyama, T. / Shinohe, T. | British Library Online Contents | 2002

    Characterization of Fast Switching Capability for Diamond Schottky Barrier Diode

    Funaki, T. / Kodama, K. / Umezawa, H. et al. | British Library Online Contents | 2011

    Reverse Current Conduction Mechanism of Transient Voltage Suppression Diode under Electrostatic Discharge Stress

    Bouangeune, D. / Lee, Y.-J. / Cho, D.-H. et al. | British Library Online Contents | 2014

    Post Annealing Etch Process for Improved Reverse Characteristics of 4H-SiC Diode

    Kang, I.H. / Bahng, W. / Joo, S.J. et al. | British Library Online Contents | 2009

    Back to top