Charge defects and highly enhanced multiferroic properties in Mn and Cu co-doped BiFeO"3 thin films: Fid-Bau Portal

Charge defects and highly enhanced multiferroic properties in Mn and Cu co-doped BiFeO"3 thin films

Dong, G. / Tan, G. / Luo, Y. / Liu, W. / Xia, A. / Ren, H.

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Charge defects and highly enhanced multiferroic properties in Mn and Cu co-doped BiFeO"3 thin films

Dong, G. / Tan, G. / Luo, Y. / Liu, W. / Xia, A. / Ren, H.

Charge defects and highly enhanced multiferroic properties in Mn and Cu co-doped BiFeO"3 thin films

Dong, G. / Tan, G. / Luo, Y. / Liu, W. / Xia, A. / Ren, H.

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Access via TIB

Check availability in my library

Order at Subito €

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Document information

Title:

Charge defects and highly enhanced multiferroic properties in Mn and Cu co-doped BiFeO"3 thin films

Contributors:

Dong, G. (author) / Tan, G. (author) / Luo, Y. (author) / Liu, W. (author) / Xia, A. (author) / Ren, H. (author)

Published in:

APPLIED SURFACE SCIENCE ; 305 ; 55-61

Publication date:

2014-01-01

Size:

7 pages

ISSN:

0169-4332

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 621.35

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