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    XPS analysis and structural and morphological characterization of Cu"2ZnSnS"4 thin films grown by sequential evaporation

    New search for: Gordillo, G.
    New search for: Calderon, C.
    New search for: Bartolo-Perez, P.

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    XPS analysis and structural and morphological characterization of Cu"2ZnSnS"4 thin films grown by sequential evaporation

    New search for: Gordillo, G.
    New search for: Calderon, C.
    New search for: Bartolo-Perez, P.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    XPS analysis and structural and morphological characterization of Cu"2ZnSnS"4 thin films grown by sequential evaporation

    New search for: Gordillo, G.
    New search for: Calderon, C.
    New search for: Bartolo-Perez, P.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

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    Document information
    Similar titles

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    Document information
    Title:

    XPS analysis and structural and morphological characterization of Cu"2ZnSnS"4 thin films grown by sequential evaporation

    Contributors:

    Gordillo, G. (author) / Calderon, C. (author) / Bartolo-Perez, P. (author)

    Published in:

    APPLIED SURFACE SCIENCE ; 305 ; 506-514

    Publication date:

    2014-01-01

    Size:

    9 pages

    ISSN:

    0169-4332

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  621.35

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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