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Boost Up Mobility of Solution-Processed Metal Oxide Thin-Film Transistors via Confining Structure on Electron Pathways

Rim, Y. S. / Chen, H. / Kou, X. / Duan, H. S. / Zhou, H. / Cai, M. / Kim, H. J. / Yang, Y.

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Boost Up Mobility of Solution-Processed Metal Oxide Thin-Film Transistors via Confining Structure on Electron Pathways

Rim, Y. S. / Chen, H. / Kou, X. / Duan, H. S. / Zhou, H. / Cai, M. / Kim, H. J. / Yang, Y.

Boost Up Mobility of Solution-Processed Metal Oxide Thin-Film Transistors via Confining Structure on Electron Pathways

Rim, Y. S. / Chen, H. / Kou, X. / Duan, H. S. / Zhou, H. / Cai, M. / Kim, H. J. / Yang, Y.

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Order at Subito €

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Document information

Title:

Boost Up Mobility of Solution-Processed Metal Oxide Thin-Film Transistors via Confining Structure on Electron Pathways

Contributors:

Rim, Y. S. (author) / Chen, H. (author) / Kou, X. (author) / Duan, H. S. (author) / Zhou, H. (author) / Cai, M. (author) / Kim, H. J. (author) / Yang, Y. (author)

Published in:

ADVANCED MATERIALS -DEERFIELD BEACH THEN WEINHEIM- ; 26 ; 4273-4278

Publication date:

2014-01-01

Size:

6 pages

ISSN:

0935-9648

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

Lin, Yen‐Hung / Faber, Hendrik / Labram, John G. et al. | Wiley | 2015

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