A Model of Ferroelectric Field-Effect Transistor after Ionizing Radiation: Fid-Bau Portal

A Model of Ferroelectric Field-Effect Transistor after Ionizing Radiation

Li, Z. / Xiao, Y.G. / Tang, M.H. / Chen, J.W. / Ding, H. / Yan, S.A. / Zhou, Y.C.

Access

Access via TIB

Check availability in my library

Order at Subito €

Page navigation

Document information

Similar titles

Export, share and cite

A Model of Ferroelectric Field-Effect Transistor after Ionizing Radiation

Li, Z. / Xiao, Y.G. / Tang, M.H. / Chen, J.W. / Ding, H. / Yan, S.A. / Zhou, Y.C.

A Model of Ferroelectric Field-Effect Transistor after Ionizing Radiation

Li, Z. / Xiao, Y.G. / Tang, M.H. / Chen, J.W. / Ding, H. / Yan, S.A. / Zhou, Y.C.

Access

Access via TIB

Check availability in my library

Order at Subito €

Page navigation

Document information

Similar titles

Export, share and cite

Document information

Title:

A Model of Ferroelectric Field-Effect Transistor after Ionizing Radiation

Contributors:

Li, Z. (author) / Xiao, Y.G. (author) / Tang, M.H. (author) / Chen, J.W. (author) / Ding, H. (author) / Yan, S.A. (author) / Zhou, Y.C. (author)

Published in:

MATERIALS SCIENCE FORUM ; 787 ; 247-255

Publication date:

2014-01-01

Size:

9 pages

ISSN:

0255-5476

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

Elsevier | 1984

Ferroelectric Field‐Effect‐Transistor Integrated with Ferroelectrics Heterostructure

Baek, Sungpyo / Yoo, Hyun Ho / Ju, Jae Hyeok et al. | Wiley | 2022

Free access

Dosimeter for ionizing radiation

Elsevier | 1990

Ferroelectric Field‐Effect‐Transistor Integrated with Ferroelectrics Heterostructure (Adv. Sci. 21/2022)

Baek, Sungpyo / Yoo, Hyun Ho / Ju, Jae Hyeok et al. | Wiley | 2022

Free access

Ionizing Radiation Effect on PMMA Measured by Microhardness

Manas, D. / Ovsik, M. / Manas, M. et al. | British Library Online Contents | 2014