Characterisation of YSZ Layers Deposited on Y~2O~3 Buffered Textured Tapes for Coated Conductors: Fid-Bau Portal

Characterisation of YSZ Layers Deposited on Y~2O~3 Buffered Textured Tapes for Coated Conductors

Xia, Y.D. / Xiong, J. / Zhang, F. / Xue, Y. / Hu, K. / Zhao, X.H. / Tao, B.W.

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Characterisation of YSZ Layers Deposited on Y~2O~3 Buffered Textured Tapes for Coated Conductors

Xia, Y.D. / Xiong, J. / Zhang, F. / Xue, Y. / Hu, K. / Zhao, X.H. / Tao, B.W.

Characterisation of YSZ Layers Deposited on Y~2O~3 Buffered Textured Tapes for Coated Conductors

Xia, Y.D. / Xiong, J. / Zhang, F. / Xue, Y. / Hu, K. / Zhao, X.H. / Tao, B.W.

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Document information

Title:

Characterisation of YSZ Layers Deposited on Y~2O~3 Buffered Textured Tapes for Coated Conductors

Contributors:

Xia, Y.D. (author) / Xiong, J. (author) / Zhang, F. (author) / Xue, Y. (author) / Hu, K. (author) / Zhao, X.H. (author) / Tao, B.W. (author)

Published in:

MATERIALS SCIENCE FORUM ; 787 ; 425-430

Publication date:

2014-01-01

Size:

6 pages

ISSN:

0255-5476

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

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