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Effect of piezoelectricity on critical thickness for misfit dislocation formation at InGaN/GaN interface
Effect of piezoelectricity on critical thickness for misfit dislocation formation at InGaN/GaN interface
Effect of piezoelectricity on critical thickness for misfit dislocation formation at InGaN/GaN interface
Mishra, D. (author) / Cho, Y. H. (author) / Shim, M. B. (author) / Hwang, S. (author) / Kim, S. (author) / Park, C. Y. (author) / Seo, S. Y. (author) / Yoo, S. H. (author) / Park, S. H. (author) / Pak, Y. E. (author)
COMPUTATIONAL MATERIALS SCIENCE ; 97 ; 254-262
2015-01-01
9 pages
Article (Journal)
English
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