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Direct observation of the thickness effect on critical crack tip opening displacement in freestanding copper submicron-films by in situ electron microscopy fracture toughness testing
Direct observation of the thickness effect on critical crack tip opening displacement in freestanding copper submicron-films by in situ electron microscopy fracture toughness testing
Direct observation of the thickness effect on critical crack tip opening displacement in freestanding copper submicron-films by in situ electron microscopy fracture toughness testing
Hirakata, H. (author) / Takeda, Y. (author) / Kondo, T. (author) / Minoshima, K. (author)
INTERNATIONAL JOURNAL OF FRACTURE ; 192 ; 203-216
2015-01-01
14 pages
Article (Journal)
English
DDC:
620.1126
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