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Development of nanotopography during SIMS characterization of thin films of Ge1−xSnx alloy
Development of nanotopography during SIMS characterization of thin films of Ge1−xSnx alloy
Development of nanotopography during SIMS characterization of thin films of Ge1−xSnx alloy
Secchi, M. (author) / Demenev, E. (author) / Colaux, J. L. (author) / Giubertoni, D. (author) / Dell’Anna, R. (author) / Iacob, E. (author) / Gwilliam, R. M. (author) / Jeynes, C. (author) / Bersani, M. (author)
APPLIED SURFACE SCIENCE ; 356 ; 422-428
2015-01-01
7 pages
Article (Journal)
English
DDC:
621.35
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