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Quantitative correlation of interfacial contamination and antiphase domain boundary density in GaAs on Si(100)
Quantitative correlation of interfacial contamination and antiphase domain boundary density in GaAs on Si(100)
Quantitative correlation of interfacial contamination and antiphase domain boundary density in GaAs on Si(100)
Barrett, C. S. (author) / Lind, A. G. (author) / Bao, X. (author) / Ye, Z. (author) / Ban, K. Y. (author) / Martin, P. (author) / Sanchez, E. (author) / Xin, Y. (author) / Jones, K. S. (author)
JOURNAL OF MATERIALS SCIENCE ; 51 ; 449-456
2016-01-01
8 pages
Article (Journal)
English
DDC:
620.11
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