Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Quantitative correlation of interfacial contamination and antiphase domain boundary density in GaAs on Si(100)
Quantitative correlation of interfacial contamination and antiphase domain boundary density in GaAs on Si(100)
Quantitative correlation of interfacial contamination and antiphase domain boundary density in GaAs on Si(100)
Barrett, C. S. (Autor:in) / Lind, A. G. (Autor:in) / Bao, X. (Autor:in) / Ye, Z. (Autor:in) / Ban, K. Y. (Autor:in) / Martin, P. (Autor:in) / Sanchez, E. (Autor:in) / Xin, Y. (Autor:in) / Jones, K. S. (Autor:in)
JOURNAL OF MATERIALS SCIENCE ; 51 ; 449-456
01.01.2016
8 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
Thermal Drag of the Antiphase Domain-Boundary Motion
| British Library Conference Proceedings | 1998
Antiphase domain morphologies in Ti3Al-Si alloys
| British Library Online Contents | 2003
TEM Study of Inversion Antiphase Domain Boundaries on GaAs/Si Interphase Grown by MBE
| British Library Online Contents | 1993
Calculation of antiphase boundary energies in intermetallics
| British Library Online Contents | 1997
Antiphase Boundary Migration and Domain Coarsening in Bulk and Thin-Foil Fe-Al Specimens
| Springer Verlag | 1988