Fachinformationsdienst BAUdigital

A platform for research: civil engineering, architecture and urbanism

    Synchrotron-radiation XPS analysis of ultra-thin silane films: Specifying the organic silicon

    New search for: Dietrich, P. M.
    New search for: Glamsch, S.
    New search for: Ehlert, C.
    New search for: Lippitz, A.
    New search for: Kulak, N.
    New search for: Unger, W. E.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Synchrotron-radiation XPS analysis of ultra-thin silane films: Specifying the organic silicon

    New search for: Dietrich, P. M.
    New search for: Glamsch, S.
    New search for: Ehlert, C.
    New search for: Lippitz, A.
    New search for: Kulak, N.
    New search for: Unger, W. E.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Synchrotron-radiation XPS analysis of ultra-thin silane films: Specifying the organic silicon

    New search for: Dietrich, P. M.
    New search for: Glamsch, S.
    New search for: Ehlert, C.
    New search for: Lippitz, A.
    New search for: Kulak, N.
    New search for: Unger, W. E.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Synchrotron-radiation XPS analysis of ultra-thin silane films: Specifying the organic silicon

    Contributors:

    Dietrich, P. M. (author) / Glamsch, S. (author) / Ehlert, C. (author) / Lippitz, A. (author) / Kulak, N. (author) / Unger, W. E. (author)

    Published in:

    APPLIED SURFACE SCIENCE ; 363 ; 406-411

    Publication date:

    2016-01-01

    Size:

    6 pages

    ISSN:

    0169-4332

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  621.35

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

    Similar titles

    Characterisation of thin films of organic phosphorescent materials using synchrotron radiation

    Thompson, J. / Arima, V. / Matino, F. et al. | British Library Online Contents | 2005

    Magnetism of ultra-thin iron films seen by the nuclear resonant scattering of synchrotron radiation

    Slezak, T. / Stankov, S. / Zajac, M. et al. | British Library Online Contents | 2008

    Use of ultra-thin organic silane films for the improvement of gold adhesion to the silicon dioxide wafers for (bio)sensor applications

    Ali, M. B. / Bessueille, F. / Chovelon, J. M. et al. | British Library Online Contents | 2008

    Microstructure of hydrogenated silicon thin films prepared from silane diluted with hydrogen

    Mullerova, J. / Sutta, P. / van Elzakker, G. et al. | British Library Online Contents | 2008

    Deposition of Teflon-polymer thin films by synchrotron radiation photodecomposition

    Katoh, T. / Zhang, Y. | British Library Online Contents | 1999

    Back to top