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An Improved Method of Projected Area Determination in Nanoindentation Using Image Processing With Sub-Pixel Edge Location
An Improved Method of Projected Area Determination in Nanoindentation Using Image Processing With Sub-Pixel Edge Location
An Improved Method of Projected Area Determination in Nanoindentation Using Image Processing With Sub-Pixel Edge Location
Thoo, H. W. (author) / Ratnam, M. M. (author)
EXPERIMENTAL TECHNIQUES ; 40 ; 803-818
2016-01-01
16 pages
Article (Journal)
English
DDC:
620.11
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