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Structure and roughness analysis of thin epitaxial Pd films grown on Cu/Si(111) surface

Davydenko, A. V. / Kozlov, A. G. / Ognev, A. V. / Stebliy, M. E. / Chebotkevich, L. A.

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Structure and roughness analysis of thin epitaxial Pd films grown on Cu/Si(111) surface

Davydenko, A. V. / Kozlov, A. G. / Ognev, A. V. / Stebliy, M. E. / Chebotkevich, L. A.

Structure and roughness analysis of thin epitaxial Pd films grown on Cu/Si(111) surface

Davydenko, A. V. / Kozlov, A. G. / Ognev, A. V. / Stebliy, M. E. / Chebotkevich, L. A.

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Document information

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Document information

Title:

Structure and roughness analysis of thin epitaxial Pd films grown on Cu/Si(111) surface

Contributors:

Davydenko, A. V. (author) / Kozlov, A. G. (author) / Ognev, A. V. (author) / Stebliy, M. E. (author) / Chebotkevich, L. A. (author)

Published in:

APPLIED SURFACE SCIENCE ; 384 ; 406-412

Publication date:

2016-01-01

Size:

7 pages

ISSN:

0169-4332

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 621.35

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