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Quantitative Scanning Probe Microscopy for Nanomechanical Forensics

DelRio, F. W. / Cook, R. F.

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Quantitative Scanning Probe Microscopy for Nanomechanical Forensics

DelRio, F. W. / Cook, R. F.

Quantitative Scanning Probe Microscopy for Nanomechanical Forensics

DelRio, F. W. / Cook, R. F.

Access

Access via TIB

Check availability in my library

Order at Subito €

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Document information

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Document information

Title:

Quantitative Scanning Probe Microscopy for Nanomechanical Forensics

Contributors:

DelRio, F. W. (author) / Cook, R. F. (author)

Published in:

EXPERIMENTAL MECHANICS ; 57 ; 1045-1055

Publication date:

2017-01-01

Size:

11 pages

ISSN:

0014-4851

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.1

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