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    Effects of Heterogeneous Cracking of Superconducting Layer on Voltage-Current Curve, Critical Current, and n-Value in High-Temperature Superconducting Layer-Coated Conductor Tape

    New search for: Ochiai, Shojiro
    New search for: Okuda, Hiroshi
    New search for: Fujii, Noriyuki
    New search for: Osamura, Kozo

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    Effects of Heterogeneous Cracking of Superconducting Layer on Voltage-Current Curve, Critical Current, and n-Value in High-Temperature Superconducting Layer-Coated Conductor Tape

    New search for: Ochiai, Shojiro
    New search for: Okuda, Hiroshi
    New search for: Fujii, Noriyuki
    New search for: Osamura, Kozo

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Effects of Heterogeneous Cracking of Superconducting Layer on Voltage-Current Curve, Critical Current, and n-Value in High-Temperature Superconducting Layer-Coated Conductor Tape

    New search for: Ochiai, Shojiro
    New search for: Okuda, Hiroshi
    New search for: Fujii, Noriyuki
    New search for: Osamura, Kozo

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Effects of Heterogeneous Cracking of Superconducting Layer on Voltage-Current Curve, Critical Current, and n-Value in High-Temperature Superconducting Layer-Coated Conductor Tape

    Contributors:

    Ochiai, Shojiro (author) / Okuda, Hiroshi (author) / Fujii, Noriyuki (author) / Osamura, Kozo (author)

    Published in:

    Materials transactions ; 56 ; 381-388

    Publication date:

    2015-01-01

    Size:

    8 pages

    ISSN:

    1345-9678

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.1105

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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