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    Features of Crack Size Distribution- and Voltage Probe Spacing-Dependences of Critical Current and n-Value in Cracked Superconducting Tape, Depicted by Simulation

    New search for: Ochiai, Shojiro
    New search for: Okuda, Hiroshi
    New search for: Fujii, Noriyuki

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    Features of Crack Size Distribution- and Voltage Probe Spacing-Dependences of Critical Current and n-Value in Cracked Superconducting Tape, Depicted by Simulation

    New search for: Ochiai, Shojiro
    New search for: Okuda, Hiroshi
    New search for: Fujii, Noriyuki

    Access

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    Check availability in my library
    Order at Subito €

    Features of Crack Size Distribution- and Voltage Probe Spacing-Dependences of Critical Current and n-Value in Cracked Superconducting Tape, Depicted by Simulation

    New search for: Ochiai, Shojiro
    New search for: Okuda, Hiroshi
    New search for: Fujii, Noriyuki

    Access

    Access via TIB
    Check availability in my library
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    Access

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    Document information
    Title:

    Features of Crack Size Distribution- and Voltage Probe Spacing-Dependences of Critical Current and n-Value in Cracked Superconducting Tape, Depicted by Simulation

    Contributors:

    Ochiai, Shojiro (author) / Okuda, Hiroshi (author) / Fujii, Noriyuki (author)

    Published in:

    Materials transactions ; 59 ; 1628-1636

    Publication date:

    2018-01-01

    Size:

    9 pages

    ISSN:

    1345-9678

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.1105

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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