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    Recent Progress of Surface Analysis (AES, XPS, and TOF-SIMS) and Their Application to Corrosion Analysis

    New search for: Sanada, Noriaki

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    Recent Progress of Surface Analysis (AES, XPS, and TOF-SIMS) and Their Application to Corrosion Analysis

    New search for: Sanada, Noriaki

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Recent Progress of Surface Analysis (AES, XPS, and TOF-SIMS) and Their Application to Corrosion Analysis

    New search for: Sanada, Noriaki

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
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    Document information
    Similar titles

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    Document information
    Title:

    Recent Progress of Surface Analysis (AES, XPS, and TOF-SIMS) and Their Application to Corrosion Analysis

    Contributors:

    Sanada, Noriaki (author)

    Published in:

    Zairyō to kankyō = ; 64 ; 388-392

    Publication date:

    2015-01-01

    Size:

    5 pages

    ISSN:

    0917-0480

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    Unknown

    Classification:

    DDC:  620.11223

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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