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Binary Resolution Matrix Based Incremental Attribute Reduction for Fault Diagnosis

Chen, X. Y. / Du, W. L. / Li, A. S. / Li, K. / Qian, C. H.

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Binary Resolution Matrix Based Incremental Attribute Reduction for Fault Diagnosis

Chen, X. Y. / Du, W. L. / Li, A. S. / Li, K. / Qian, C. H.

Binary Resolution Matrix Based Incremental Attribute Reduction for Fault Diagnosis

Chen, X. Y. / Du, W. L. / Li, A. S. / Li, K. / Qian, C. H.

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Document information

Title:

Binary Resolution Matrix Based Incremental Attribute Reduction for Fault Diagnosis

Contributors:

Chen, X. Y. (author) / Du, W. L. (author) / Li, A. S. (author) / Li, K. (author) / Qian, C. H. (author)

Published in:

Key engineering materials ; 693 ; 1346-1349

Publication date:

2016-01-01

Size:

4 pages

ISSN:

1013-9826

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.1105

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