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Evaluation of Two Process Yields in Acceptance Sampling Plans

Butt, K. A. / Aslam, M. / Wang, F.-K. / Lee, H. / Jun, C.-H.

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Evaluation of Two Process Yields in Acceptance Sampling Plans

Butt, K. A. / Aslam, M. / Wang, F.-K. / Lee, H. / Jun, C.-H.

Evaluation of Two Process Yields in Acceptance Sampling Plans

Butt, K. A. / Aslam, M. / Wang, F.-K. / Lee, H. / Jun, C.-H.

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Access via TIB

Check availability in my library

Order at Subito €

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Document information

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Document information

Title:

Evaluation of Two Process Yields in Acceptance Sampling Plans

Contributors:

Butt, K. A. (author) / Aslam, M. (author) / Wang, F.-K. (author) / Lee, H. (author) / Jun, C.-H. (author)

Published in:

Journal of testing and evaluation ; 46 ; 756-763

Publication date:

2018-01-01

Size:

8 pages

ISSN:

0090-3973

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.0044

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