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    Temperature dependent electrical and dielectric properties of a metal/Dy2O3/n-GaAs (MOS) structure

    New search for: Saghrouni, H.
    New search for: Jomni, S.
    New search for: Belgacem, W.
    New search for: Elghoul, N.
    New search for: Beji, L.

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    Temperature dependent electrical and dielectric properties of a metal/Dy2O3/n-GaAs (MOS) structure

    New search for: Saghrouni, H.
    New search for: Jomni, S.
    New search for: Belgacem, W.
    New search for: Elghoul, N.
    New search for: Beji, L.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Temperature dependent electrical and dielectric properties of a metal/Dy2O3/n-GaAs (MOS) structure

    New search for: Saghrouni, H.
    New search for: Jomni, S.
    New search for: Belgacem, W.
    New search for: Elghoul, N.
    New search for: Beji, L.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Temperature dependent electrical and dielectric properties of a metal/Dy2O3/n-GaAs (MOS) structure

    Contributors:

    Saghrouni, H. (author) / Jomni, S. (author) / Belgacem, W. (author) / Elghoul, N. (author) / Beji, L. (author)

    Published in:

    Materials science in semiconductor processing ; 29 ; 307-314

    Publication date:

    2015-01-01

    Size:

    8 pages

    ISSN:

    1369-8001

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  621.38152

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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