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    On-chip fracture testing of freestanding nanoscale materials

    New search for: Vayrette, Renaud
    New search for: Raskin, Jean-Pierre
    New search for: Pardoen, Thomas

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    On-chip fracture testing of freestanding nanoscale materials

    New search for: Vayrette, Renaud
    New search for: Raskin, Jean-Pierre
    New search for: Pardoen, Thomas

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    On-chip fracture testing of freestanding nanoscale materials

    New search for: Vayrette, Renaud
    New search for: Raskin, Jean-Pierre
    New search for: Pardoen, Thomas

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    On-chip fracture testing of freestanding nanoscale materials

    Contributors:

    Vayrette, Renaud (author) / Raskin, Jean-Pierre (author) / Pardoen, Thomas (author)

    Published in:

    Engineering fracture mechanics ; 150 ; 222-238

    Publication date:

    2015-01-01

    Size:

    17 pages

    ISSN:

    0013-7944

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.112605

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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