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Size dependent fracture strength and cracking mechanisms in freestanding polycrystalline silicon films with nanoscale thickness
Size dependent fracture strength and cracking mechanisms in freestanding polycrystalline silicon films with nanoscale thickness
Size dependent fracture strength and cracking mechanisms in freestanding polycrystalline silicon films with nanoscale thickness
Vayrette, R. (author) / Galceran, M. (author) / Coulombier, M. (author) / Godet, S. (author) / Raskin, J.-P. (author) / Pardoen, T. (author)
Engineering fracture mechanics ; 168 ; 190-203
2016-01-01
14 pages
Article (Journal)
English
DDC:
620.112605
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