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    Adaptation of admittance analysis to extract interface traps of a-Si:H/c-Si heterojunctions

    New search for: Menda, Ugur Deneb
    New search for: Özdemir, Orhan

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    Adaptation of admittance analysis to extract interface traps of a-Si:H/c-Si heterojunctions

    New search for: Menda, Ugur Deneb
    New search for: Özdemir, Orhan

    Access

    Access via TIB
    Check availability in my library
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    Adaptation of admittance analysis to extract interface traps of a-Si:H/c-Si heterojunctions

    New search for: Menda, Ugur Deneb
    New search for: Özdemir, Orhan

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

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    Document information
    Title:

    Adaptation of admittance analysis to extract interface traps of a-Si:H/c-Si heterojunctions

    Contributors:

    Menda, Ugur Deneb (author) / Özdemir, Orhan (author)

    Published in:

    Materials science in semiconductor processing ; 40 ; 171-175

    Publication date:

    2015-01-01

    Size:

    5 pages

    ISSN:

    1369-8001

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  621.38152

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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