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    Effects of film thickness on critical crack tip opening displacement in single-crystalline and polycrystalline submicron Cu films

    New search for: Hirakata, Hiroyuki
    New search for: Yoshida, Takuya
    New search for: Kondo, Toshiyuki
    New search for: Minoshima, Kohji

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    Effects of film thickness on critical crack tip opening displacement in single-crystalline and polycrystalline submicron Cu films

    New search for: Hirakata, Hiroyuki
    New search for: Yoshida, Takuya
    New search for: Kondo, Toshiyuki
    New search for: Minoshima, Kohji

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Effects of film thickness on critical crack tip opening displacement in single-crystalline and polycrystalline submicron Cu films

    New search for: Hirakata, Hiroyuki
    New search for: Yoshida, Takuya
    New search for: Kondo, Toshiyuki
    New search for: Minoshima, Kohji

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

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    Document information
    Title:

    Effects of film thickness on critical crack tip opening displacement in single-crystalline and polycrystalline submicron Cu films

    Contributors:

    Hirakata, Hiroyuki (author) / Yoshida, Takuya (author) / Kondo, Toshiyuki (author) / Minoshima, Kohji (author)

    Published in:

    Engineering fracture mechanics ; 159 ; 98-114

    Publication date:

    2016-01-01

    Size:

    17 pages

    ISSN:

    0013-7944

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.112605

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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