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    Multifractal analysis and optical properties of nanostructured silicon layers

    New search for: Jurečka, Stanislav
    New search for: Matsumoto, Taketoshi
    New search for: Imamura, Kentaro
    New search for: Kobayashi, Hikaru

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    Multifractal analysis and optical properties of nanostructured silicon layers

    New search for: Jurečka, Stanislav
    New search for: Matsumoto, Taketoshi
    New search for: Imamura, Kentaro
    New search for: Kobayashi, Hikaru

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Multifractal analysis and optical properties of nanostructured silicon layers

    New search for: Jurečka, Stanislav
    New search for: Matsumoto, Taketoshi
    New search for: Imamura, Kentaro
    New search for: Kobayashi, Hikaru

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Multifractal analysis and optical properties of nanostructured silicon layers

    Contributors:

    Jurečka, Stanislav (author) / Matsumoto, Taketoshi (author) / Imamura, Kentaro (author) / Kobayashi, Hikaru (author)

    Published in:

    Applied surface science ; 395 ; 150-156

    Publication date:

    2017-01-01

    Size:

    7 pages

    ISSN:

    0169-4332

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.44

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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