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    Double stack layer structure of SiNx/pm-Si thin films for downshifting and antireflection properties

    New search for: Mon-Pérez, E.
    New search for: Dutt, A.
    New search for: Santoyo-Salazar, J.
    New search for: Sánchez, M.
    New search for: Santana, G.

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    Double stack layer structure of SiNx/pm-Si thin films for downshifting and antireflection properties

    New search for: Mon-Pérez, E.
    New search for: Dutt, A.
    New search for: Santoyo-Salazar, J.
    New search for: Sánchez, M.
    New search for: Santana, G.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Double stack layer structure of SiNx/pm-Si thin films for downshifting and antireflection properties

    New search for: Mon-Pérez, E.
    New search for: Dutt, A.
    New search for: Santoyo-Salazar, J.
    New search for: Sánchez, M.
    New search for: Santana, G.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Double stack layer structure of SiNx/pm-Si thin films for downshifting and antireflection properties

    Contributors:

    Mon-Pérez, E. (author) / Dutt, A. (author) / Santoyo-Salazar, J. (author) / Sánchez, M. (author) / Santana, G. (author)

    Published in:

    MATERIALS LETTERS ; 203 ; 50-53

    Publication date:

    2017-01-01

    Size:

    4 pages

    ISSN:

    0167-577X

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    Unknown

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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