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Nanoscale characterization of CH3-terminated Self-Assembled Monolayer on copper by advanced scanning probe microscopy techniques
Nanoscale characterization of CH3-terminated Self-Assembled Monolayer on copper by advanced scanning probe microscopy techniques
Nanoscale characterization of CH3-terminated Self-Assembled Monolayer on copper by advanced scanning probe microscopy techniques
Berthold, Tobias (author) / Benstetter, Guenther (author) / Frammelsberger, Werner (author) / Rodríguez, Rosana (author) / Nafría, Montserrat (author)
Applied surface science ; 356 ; 921-926
2015-01-01
6 pages
Article (Journal)
English
DDC:
620.44
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