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    Nanoscale characterization of CH3-terminated Self-Assembled Monolayer on copper by advanced scanning probe microscopy techniques

    New search for: Berthold, T.
    New search for: Benstetter, G.
    New search for: Frammelsberger, W.
    New search for: Rodríguez, R.
    New search for: Nafría, M.

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    Nanoscale characterization of CH3-terminated Self-Assembled Monolayer on copper by advanced scanning probe microscopy techniques

    New search for: Berthold, T.
    New search for: Benstetter, G.
    New search for: Frammelsberger, W.
    New search for: Rodríguez, R.
    New search for: Nafría, M.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Nanoscale characterization of CH3-terminated Self-Assembled Monolayer on copper by advanced scanning probe microscopy techniques

    New search for: Berthold, T.
    New search for: Benstetter, G.
    New search for: Frammelsberger, W.
    New search for: Rodríguez, R.
    New search for: Nafría, M.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

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    Document information
    Title:

    Nanoscale characterization of CH3-terminated Self-Assembled Monolayer on copper by advanced scanning probe microscopy techniques

    Contributors:

    Berthold, T. (author) / Benstetter, G. (author) / Frammelsberger, W. (author) / Rodríguez, R. (author) / Nafría, M. (author)

    Published in:

    APPLIED SURFACE SCIENCE ; 356 ; 921-926

    Publication date:

    2015-01-01

    Size:

    6 pages

    ISSN:

    0169-4332

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  621.35

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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