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Effect of hydrogen ion beam treatment on Si nanocrystal/SiO2 superlattice-based memory devices
Effect of hydrogen ion beam treatment on Si nanocrystal/SiO2 superlattice-based memory devices
Effect of hydrogen ion beam treatment on Si nanocrystal/SiO2 superlattice-based memory devices
Fu, Sheng-Wen (author) / Chen, Hui-Ju (author) / Wu, Hsuan-Ta (author) / Chuang, Bing-Ru (author) / Shih, Chuan-Feng (author)
Applied surface science ; 367 ; 134-139
2016-01-01
6 pages
Article (Journal)
English
DDC:
620.44
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