Strain path dependence of microstructure and annealing behavior in high purity tantalum: Fid-Bau Portal

Strain path dependence of microstructure and annealing behavior in high purity tantalum

Liu, Y.H. / Liu, S.F. / Zhu, J.L. / Deng, C. / Fan, H.Y. / Cao, L.F. / Liu, Q.

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Strain path dependence of microstructure and annealing behavior in high purity tantalum

Liu, Y.H. / Liu, S.F. / Zhu, J.L. / Deng, C. / Fan, H.Y. / Cao, L.F. / Liu, Q.

Strain path dependence of microstructure and annealing behavior in high purity tantalum

Liu, Y.H. / Liu, S.F. / Zhu, J.L. / Deng, C. / Fan, H.Y. / Cao, L.F. / Liu, Q.

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Check availability in my library

Order at Subito €

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Document information

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Document information

Title:

Strain path dependence of microstructure and annealing behavior in high purity tantalum

Contributors:

Liu, Y.H. (author) / Liu, S.F. (author) / Zhu, J.L. (author) / Deng, C. (author) / Fan, H.Y. (author) / Cao, L.F. (author) / Liu, Q. (author)

Published in:

MATERIALS SCIENCE AND ENGINEERING A ; 707 ; 518-530

Publication date:

2017-01-01

Size:

13 pages

ISSN:

0921-5093

Type of media:

Article (Journal)

Type of material:

Language:

Unknown

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