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    EXAFS study of local structure contributing to Sn stability in SiyGe1-y-zSnz

    New search for: Shimura, Yosuke
    New search for: Asano, Takanori
    New search for: Yamaha, Takashi
    New search for: Fukuda, Masahiro
    New search for: Takeuchi, Wakana
    New search for: Nakatsuka, Osamu
    New search for: Zaima, Shigeaki

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    EXAFS study of local structure contributing to Sn stability in SiyGe1-y-zSnz

    New search for: Shimura, Yosuke
    New search for: Asano, Takanori
    New search for: Yamaha, Takashi
    New search for: Fukuda, Masahiro
    New search for: Takeuchi, Wakana
    New search for: Nakatsuka, Osamu
    New search for: Zaima, Shigeaki

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    EXAFS study of local structure contributing to Sn stability in SiyGe1-y-zSnz

    New search for: Shimura, Yosuke
    New search for: Asano, Takanori
    New search for: Yamaha, Takashi
    New search for: Fukuda, Masahiro
    New search for: Takeuchi, Wakana
    New search for: Nakatsuka, Osamu
    New search for: Zaima, Shigeaki

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

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    Document information
    Similar titles

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    Document information
    Title:

    EXAFS study of local structure contributing to Sn stability in SiyGe1-y-zSnz

    Contributors:

    Shimura, Yosuke (author) / Asano, Takanori (author) / Yamaha, Takashi (author) / Fukuda, Masahiro (author) / Takeuchi, Wakana (author) / Nakatsuka, Osamu (author) / Zaima, Shigeaki (author)

    Published in:

    Materials science in semiconductor processing ; 70 ; 133-138

    Publication date:

    2017-01-01

    Size:

    6 pages

    ISSN:

    1369-8001

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  621.38152

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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