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    Ellipsometric characterization and optical anisotropy of nanostructured CuIn3S5 and CuIn5S8 thin films

    New search for: Akkari, F. Chaffar
    New search for: Abdelkader, D.
    New search for: Gallas, B.
    New search for: Kanzari, M.

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    Ellipsometric characterization and optical anisotropy of nanostructured CuIn3S5 and CuIn5S8 thin films

    New search for: Akkari, F. Chaffar
    New search for: Abdelkader, D.
    New search for: Gallas, B.
    New search for: Kanzari, M.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Ellipsometric characterization and optical anisotropy of nanostructured CuIn3S5 and CuIn5S8 thin films

    New search for: Akkari, F. Chaffar
    New search for: Abdelkader, D.
    New search for: Gallas, B.
    New search for: Kanzari, M.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

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    Document information
    Title:

    Ellipsometric characterization and optical anisotropy of nanostructured CuIn3S5 and CuIn5S8 thin films

    Contributors:

    Akkari, F. Chaffar (author) / Abdelkader, D. (author) / Gallas, B. (author) / Kanzari, M. (author)

    Published in:

    Materials science in semiconductor processing ; 71 ; 156-160

    Publication date:

    2017-01-01

    Size:

    5 pages

    ISSN:

    1369-8001

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  621.38152

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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