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Atomic nature of the Schottky barrier height formation of the Ag/GaAs(001)-2×4 interface: An in-situ synchrotron radiation photoemission study
Atomic nature of the Schottky barrier height formation of the Ag/GaAs(001)-2×4 interface: An in-situ synchrotron radiation photoemission study
Atomic nature of the Schottky barrier height formation of the Ag/GaAs(001)-2×4 interface: An in-situ synchrotron radiation photoemission study
Cheng, Chiu-Ping (author) / Chen, Wan-Sin (author) / Lin, Keng-Yung (author) / Wei, Guo-Jhen (author) / Cheng, Yi-Ting (author) / Lin, Yen-Hsun (author) / Wan, Hsien-Wen (author) / Pi, Tun-Wen (author) / Tung, Raymond T. (author) / Kwo, Jueinai (author)
Applied surface science ; 393 ; 294-298
2017-01-01
5 pages
Article (Journal)
English
DDC:
620.44
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