Investigation of interdiffusion and depth resolution in Cu/Ni multilayers by means of AES depth profiling: Fid-Bau Portal

Investigation of interdiffusion and depth resolution in Cu/Ni multilayers by means of AES depth profiling

Yan, X.L. / Liu, Y. / Swart, H.C. / Wang, J.Y. / Terblans, J.J.

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Investigation of interdiffusion and depth resolution in Cu/Ni multilayers by means of AES depth profiling

Yan, X.L. / Liu, Y. / Swart, H.C. / Wang, J.Y. / Terblans, J.J.

Investigation of interdiffusion and depth resolution in Cu/Ni multilayers by means of AES depth profiling

Yan, X.L. / Liu, Y. / Swart, H.C. / Wang, J.Y. / Terblans, J.J.

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Check availability in my library

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Document information

Title:

Investigation of interdiffusion and depth resolution in Cu/Ni multilayers by means of AES depth profiling

Contributors:

Yan, X.L. (author) / Liu, Y. (author) / Swart, H.C. (author) / Wang, J.Y. (author) / Terblans, J.J. (author)

Published in:

Applied surface science ; 364 ; 567-572

Publication date:

2016-01-01

Size:

6 pages

ISSN:

0169-4332

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.44

Yan, X. L. / Liu, Y. / Swart, H. C. et al. | British Library Online Contents | 2016

Investigation of interdiffusion and depth resolution in Cu/Ni multilayers by means of AES depth profiling

Yan, X.L. / Liu, Y. / Swart, H.C. et al. | British Library Online Contents | 2016

AES depth profiling multilayers of 3d transition metals

Baunack, S. / Menzel, S. / Bruckner, W. et al. | British Library Online Contents | 2001

SIMS depth profiling of deuterium labeled polymers in polymer multilayers

Harton, S. E. / Stevie, F. A. / Griffis, D. P. et al. | British Library Online Contents | 2006

Shave-off depth profiling: Depth profiling with an absolute depth scale

Nojima, M. / Maekawa, A. / Yamamoto, T. et al. | British Library Online Contents | 2006