Investigation of interdiffusion and depth resolution in Cu/Ni multilayers by means of AES depth profiling

Yan, X. L. / Liu, Y. / Swart, H. C. et al. | British Library Online Contents | 2016

Investigation of interdiffusion and depth resolution in Cu/Ni multilayers by means of AES depth profiling

Yan, X.L. / Liu, Y. / Swart, H.C. et al. | British Library Online Contents | 2016

AES depth profiling multilayers of 3d transition metals

Baunack, S. / Menzel, S. / Bruckner, W. et al. | British Library Online Contents | 2001

SIMS depth profiling of deuterium labeled polymers in polymer multilayers

Harton, S. E. / Stevie, F. A. / Griffis, D. P. et al. | British Library Online Contents | 2006

Shave-off depth profiling: Depth profiling with an absolute depth scale

Nojima, M. / Maekawa, A. / Yamamoto, T. et al. | British Library Online Contents | 2006